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100% Tested for Accuracy and Reliability and needed to monitor deposition rate in situ, collect accurate measurement data, optimize PVD applications, and to automate the process when coupled with a thin film controller.
Quartz crystals are needed to monitor deposition rate in situ, collect accurate measurement data, and provide a means to analyze research applications.
Compact deposition monitor built with ModeLock technology to maximize reproducibility and uniformity with the highest thickness accuracy, best measurement resolution, and lowest rate noise
Compact deposition monitor built with ModeLock technology to maximize reproducibility and uniformity with the highest thickness accuracy, best measurement resolution, and lowest rate noise
SemiQCM® SR sensor is one component of a system for precursor monitoring, with the other components being an IMM-200 and FabGuard (version 19.12.00-a or higher).
Real-time, in situ process monitoring to prevent over-etching and identify chamber clean endpoint
Increased stability, better thickness accuracy and time saved