Every step of semiconductor manufacturing depends on vacuum integrity. INFICON's helium leak detectors — from the mobile-ready UL3000 Fab Series to the high-throughput UL6000 Fab PLUS and the proven shopfloor UL1000 Fab — help fabs quickly identify leaks, shorten maintenance cycles, and standardize leak testing procedures.
Drone-enabled sampling enables fast chemical identification without exposure.
INFICON is sponsoring the Academic Motorsports Club Zurich (AMZ), the ETH Zurich student team that has set the global benchmark for electric and autonomous Formula Student racing.
Historical averages miss the structured variation that drives cycle time surprises.
How INFICON solved the back-end assignment problem for a semiconductor manufacturer.
Transpector® MPH will map water and volatiles at the Lunar South Pole to guide future astronaut landings.
Why leak detection and vacuum measurement are critical to fab uptime and yield.
How does setup time affect the cycle time benefits of qualifying a second tool in a semiconductor wafer fab?