Subscriber Discussion Forum:
FabTime Newsletter, Volume 26, No 5
We have subscriber discussion about Automated Optical Inspection (AOI).
Automated Optical Inspection
A long-time friend and subscriber wrote: “One of my concerns is AOI (Automated Optical Inspection), which has been getting popular over the last ten years. These days, we use many AOI tools in our line. AOI is good for inspecting wafer surfaces. Even though AOI process times are not long, we see long queue times for our AOI steps. When we use more AOI, we may improve yield, but we hurt cycle time. I would like to see you talk about AOI in a future issue.”
Response from Jennifer: Your timing is excellent because we were planning to talk about trade-offs between cycle time and yield in this issue. We will include AOI in our discussion in the main article.
We welcome the opportunity to publish subscriber discussion questions and responses. Submit your responses here.
Further Reading
Past issues of the newsletter are available for subscribers to download in PDF format. Existing subscribers can find the archive link in your most recent email newsletter. New subscribers will see the link upon registering.
- Register for the newsletter here.
- Main article for Volume 26, No. 5: Fab Trade-Offs: Higher Cycle Time for Higher Yield
- FabTime Newsletter Community Announcements Page